Session | ||
Rel3_Progress in Failure Analytical and Material Testing Methods
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Presentations | ||
11:00am - 11:25am
Full-field IR-Thermography for Bond-quality Inspection of Electroplated Aluminium Interconnects for Cryo-SiP Architectures 1TU Chemnitz, Chemnitz, Germany; 2Fraunhofer ENAS, Chemnitz, Germany; 3BTU Cottbus, Cottbus, Germany; 4Nanotest GmbH, Berlin, Germany 11:25am - 11:50am
Using ยต-RAMAN Spectroscopy to Inspect Sintered Interconnects 1Technische Hochschule, Germany; 2TU Chemnitz, Chemnitz, Germany 11:50am - 12:15pm
Determination of Mechanical Properties for Copper in Plated Through Holes by Combination of Tensile Test and Nanoindentation 1TU Berlin, Berlin, Germany; 2Fraunhofer IZM, Berlin, Germany |