11:00am - 11:25amFull-field IR-Thermography for Bond-quality Inspection of Electroplated Aluminium Interconnects for Cryo-SiP Architectures
Bernhard Wunderle1, Daniel May1, Imants Cirulis2, Silvia Braun2, Uwe Zschenderlein1, Jens Heilmann1, Remi Pantou2, Ralph Schacht3, Mohamad Abo Ras4
1TU Chemnitz, Chemnitz, Germany; 2Fraunhofer ENAS, Chemnitz, Germany; 3BTU Cottbus, Cottbus, Germany; 4Nanotest GmbH, Berlin, Germany
11:25am - 11:50amUsing ยต-RAMAN Spectroscopy to Inspect Sintered Interconnects
Gordon Elger1, E Liu1, Fabian Steinberger1, Bernhard Wunderle2, Zubair Mohd1
1Technische Hochschule, Germany; 2TU Chemnitz, Chemnitz, Germany
11:50am - 12:15pmDetermination of Mechanical Properties for Copper in Plated Through Holes by Combination of Tensile Test and Nanoindentation
Janine Conrad1, Olaf Wittler2, Martin Schneider-Ramelow1
1TU Berlin, Berlin, Germany; 2Fraunhofer IZM, Berlin, Germany
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