Conference Time: 23rd Nov 2024, 04:30:03pm CET
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Rel2_Package- and Board Level Moisture- and Thermal Stress-related Reliability Effects
Time:
Thursday, 12/Sept/2024:
11:00am - 12:15pm
Session Chair: Romuald Roucou , NXP
Location: MOA 1+2 MOA 1+2
Presentations
11:00am - 11:25am Boundary Conditions for Reproducible and Comparable Condensation Tests to Prove the Migration Resistance of Assemblies
Bob Wittig 1 , Adrian Kandziora1 , Gerret Asseburg2 , Markus Thoben2
1 Volkswagen AG, Germany; 2 University of Applied Science and Arts, Dortmund Soest, Germany
11:25am - 11:50am Analysis of LED Solder Joints During Combined Power and Thermal Cycling
Khalil Maarouf1,2 , Christine Roucoules 1 , Helmut Klöcker2 , Sergio Sao-Joao2
1 Valeo Vision, France; 2 Mines Saint-Etienne, Saint-Étienne, France
11:50am - 12:15pm Analysis of Degradation Effects for Different Epoxy-based Molding Compounds (EMC) Under High Temperature Aging
Falk Naumann , Tino Stephan, Marcel Mittag, Robert Klengel, Sandy Klengel
Fraunhofer IMWS, Halle, Germany