Conference Agenda

Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).

 
 
Session Overview
Session
Rel2_Package- and Board Level Moisture- and Thermal Stress-related Reliability Effects
Time:
Thursday, 12/Sept/2024:
11:00am - 12:15pm

Session Chair: Romuald Roucou, NXP
Location: MOA 1+2

MOA 1+2

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Presentations
11:00am - 11:25am

Boundary Conditions for Reproducible and Comparable Condensation Tests to Prove the Migration Resistance of Assemblies

Bob Wittig1, Adrian Kandziora1, Gerret Asseburg2, Markus Thoben2

1Volkswagen AG, Germany; 2University of Applied Science and Arts, Dortmund Soest, Germany



11:25am - 11:50am

Analysis of LED Solder Joints During Combined Power and Thermal Cycling

Khalil Maarouf1,2, Christine Roucoules1, Helmut Klöcker2, Sergio Sao-Joao2

1Valeo Vision, France; 2Mines Saint-Etienne, Saint-Étienne, France



11:50am - 12:15pm

Analysis of Degradation Effects for Different Epoxy-based Molding Compounds (EMC) Under High Temperature Aging

Falk Naumann, Tino Stephan, Marcel Mittag, Robert Klengel, Sandy Klengel

Fraunhofer IMWS, Halle, Germany



 
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