Conference Agenda

Session
AMT2_Computer-aided Process Control
Time:
Thursday, 12/Sept/2024:
11:00am - 12:15pm

Session Chair: Erik Jung, Fraunhofer IZM
 Location: MOA 4

MOA 4

Presentations
11:00am - 11:25am

Advancements in Epoxy Pattern Quality Checks: Harnessing Artificial Intelligence for Enhanced Low-Contrast Analysis

Guodong Zeng, Farnaz Forooghifar, Andreas Wiedmer, Ernst Barmettler, Norbert Ackerl

Besi Switzerland AG, Steinhausen, Switzerland


11:25am - 11:50am

Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques

Damien Jon Leech, Akito Hiro, Geert Schoofs, Bensu Tunca Altintas, Alain Phommahaxay, Koen Kennes, Gerald Beyer, Eric Beyne

imec, Belgium


11:50am - 12:15pm

AI Deep-Learning Approach for Manufacturing Optimization During Chiplets and Heterogeneous Package Inspection

Shahab Chitchian, SeungYeol Kim, TaeYoung Jung, TaeYong Lee, ByeongGweon Joo

INTEKPLUS Co., Daejeon, Korea, Republic of (South Korea)