9:15am - 9:40amHigh Precision Direct Transfer Bonding for Submicron Die-to-wafer in 3D/Heterogeneous Integration
Ichiro Sano1, Katsuya Yamada1, Yuya Hirai1, Masanori Yamagishi2, Shinya Takyu2, Yusuke Fumita2, Yoichiro Kurita3
1TAZMO CO.,LTD.; 2LINTEC Corporation; 3Tokyo Institute of Technology, Meguro City, Japan
9:40am - 10:05amBond Strength Measurement for Wafer-level and Chip-level Hybrid Bonding
Junya Fuse, Yuki Yoshihara, Marie Sano, Fumihiro Inoue
Yokohama National University, Yokohama, Japan
10:05am - 10:30amOptimization of Cu/SiCN Hybrid Bonding Process Using a Cohesive Zone Model
Dong Yan, Ali Roshanghias
Silicon Austria Labs GmbH, Heterogeneous Integration Technologies, Villach, Austria
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