Conference Time: 23rd Nov 2024, 12:57:59pm CET
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Rel1_Reliability Performance and Electromigration Behavior
Time:
Thursday, 12/Sept/2024:
9:15am - 10:30am
Session Chair: Matthias Heimann , Siemens AG
Location: MOA 1+2 MOA 1+2
Presentations
9:15am - 9:40am Electromigration Reliability of Cu3Sn Microbumps for 3D Heterogeneous Integration
Nikhilendu Tiwary 1 , Christian Grosse2 , Michael Kögel2 , Thilo Windemuth1 , Glenn Ross1 , Vesa Vuorinen1 , Sebastian Brand2 , Mervi Paulasto-Kröckel1
1 Aalto University, Espoo, Finland; 2 Fraunhofer IMWS, Halle, Germany
9:40am - 10:05am Investigating the Failure Mechanisms of Electromigration and Copper Oxide Formation in Fine-pitch Cu RDL
Adrija Chaudhuri 1 , Johannes Jaeschke1 , Astrid Gollhardt1 , Hermann Oppermann1 , Martin Schneider-Ramelow2
1 Fraunhofer IZM, Berlin, Germany; 2 TU Berlin, Berlin, Germany
10:05am - 10:30am Investigation of the Influence of Shear Height in the Wire Bond Shear Test
Simon Kuttler 1 , Olaf Wittler1 , Martin Schneider-Ramelow2
1 Fraunhofer IZM, Berlin, Germany; 2 TU Berlin, Berlin, Germany