5:00pm - 5:25pmUltra Low Temperature Hybrid Bonding: Morphological and Electrical Characterizations
Margot Faure, Christophe Dubarry, Pablo Renaud, Floriane Baudin, SĂ©bastien Dominguez, Karine Abadie, Christophe Morales, Constantin Matei, Frank Fournel
University Grenoble Alpes CEA, LETI, Grenoble, France
5:25pm - 5:50pmOverlay Scaling Error Reduction for Hybrid Die-To-wafer Bonding
Pieter Bex1, Mario Gonzalez1, Steven Brems1, Alain Phommahaxay1, Koen D`Havé1, Prathamesh Dhakras1, Dieter H. Cuypers1, Ye Lin1, Eric Beyne1, Jonathan Abdilla2, Kawsar Ahmed Prince2, Benedikt Auer2, Djuro Bikaljevic2, Manuel Deubler2, Thiago Moura2, Stefan Schmid2, Pavel Seroglazov2
1imec, Leuven, Belgium; 2BESI, Radfeld, Austria
5:50pm - 6:15pmScatterometry Application on Cu/SiCN Surface Topography Towards High Volume Manufacturing
Soon Aik Chew1, Joey Hung2, Igor Turoves2, Avron Ger2, Mohamed Saib1, Alain Moussa1, Boyao Zhang1, Joeri De Vos1, Andy Miller1, Anne-Laure Charley1, Philippe Leray1, Eric Beyne1
1imec, Loewen, Belgium; 2Nova Ltd., Rehovot, Israel
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