2:40pm - 3:05pmDynamic Calibration of Junction Temperature of SiC MOSFETs for Power Cycling
Jakob Breuer1, Fabian Dresel1, Andreas Schletz2, Juergen Leib1, Bernd Eckardt1, Martin Maerz3
1Fraunhofer IISB, Erlangen, Germany; 2SCHLETZ GmbH, Amberg, Germany; 3Friedrich-Alexander-University of Erlangen-Nürnberg, Erlangen, Germany
3:05pm - 3:30pmContact Thermography – New Findings, New Ideas
Martin Oppermann, Lea Borngräber, Oliver Albrecht, Thomas Zerna
TU Dresden, Dresden, Germany
3:30pm - 3:55pmAbrasion Characterization of Graphene-enhanced Thermal Interface Materials for Electronics Thermal Management Applications
Kristoffer Harr1, Yuanyuan Wang1, Johan Möller1, Johan Liu2
1Smart High Tech AB, Goeteborg, Sweden; 2Chalmers University of Technology, Goeteborg, Sweden
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