Session | ||
AP6_Challenges and Solutions for HI
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Presentations | ||
3:45pm - 4:10pm
Acoustic MEMS Packaging for Audio Micro-System Applications STMicroelectronics, Italy 4:10pm - 4:35pm
IMC Assisted Die-bonding for Stacked Device Integration 1Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan; 2IMEC, Leuven, Belgium 4:35pm - 5:00pm
High-throughput In-line SEM Metrology for Cu Pad Nanotopography for Hybrid Bonding Applications 1imec, Leuven, Belgium; 2Hitachi High-Tech Corporation Ibaraki, Ibraki, Japan; 3Hitachi High-Tech Corporation Tokyo, Tokyo, Japan; 4Hitachi, Ltd. Kanagawa, Kanagawa, Japan |