3:45pm - 4:10pmAcoustic MEMS Packaging for Audio Micro-System Applications
Luca Maggi, Fabrizio Cerini, Silvia Adorno, Amedeo Maierna, Marco Del Sarto, Alex Gritti, Andrea Ratti, Nazariy Nashkolnyy
STMicroelectronics, Italy
4:10pm - 4:35pmIMC Assisted Die-bonding for Stacked Device Integration
Masataka Maehara1, Jaber Derakhshandeh2, Carine Gerets2, Tom Cochet2, Dieter H Cuypers2, Andy Miller2, Gerald Beyer2, Geert Van der Plas2, Eric Beyne2
1Sony Semiconductor Solutions Corporation, Atsugi, Kanagawa, Japan; 2IMEC, Leuven, Belgium
4:35pm - 5:00pmHigh-throughput In-line SEM Metrology for Cu Pad Nanotopography for Hybrid Bonding Applications
Bensu Tunca Altintas1, Mohamed Saib1, Alain Moussa1, Soon Aik Chew1, Boyao Zhang1, Joeri De Vos1, Andy Miller1, Eric Beyne1, Gian Lorusso1, Anne-Laure Charley1, Janusz Bogdanowicz1, Hiroaki Kasai2, Kazuhisa Hasumi2, Nobuyuki Mise3, Mayuka Osaki4, Maki Tanaka2
1imec, Leuven, Belgium; 2Hitachi High-Tech Corporation Ibaraki, Ibraki, Japan; 3Hitachi High-Tech Corporation Tokyo, Tokyo, Japan; 4Hitachi, Ltd. Kanagawa, Kanagawa, Japan
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