IEEE ESTC 2024
September 11–13, 2024 | Berlin, Germany
Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Session Overview | |
Location: Atrium Exhibition |
Date: Wednesday, 11/Sept/2024 | |
11:00am - 3:00pm |
Exhibition Setup Location: Atrium |
3:00pm - 8:00pm |
Exhibition Location: Atrium |
3:55pm - 4:25pm |
Coffee Break & Exhibition Location: Atrium |
3:55pm - 5:00pm |
Poster Session 1 Location: Atrium Chair: Karl-Friedrich Becker, Fraunhofer IZM Fabrication of Fine-Pitch Cu-Sn Microbumps Using Electroplating and Wet Seed Layer Etching Eclipse Versus Conventional Optical Choppers: Modeling and Analysis Development of HTC Tests on Module Basis Low-temperature Adhesive Wafer Bonding for Film Layer Transfer Adhesive Solutions for Closed Cavity Packaging Infrared Optical Solutions for Void Inspection of Bonded Wafers and Bonding Overlay Control Investigation of RF Characteristics of Chiplet to PCB Transitions for Advanced HPC Packaging Solutions Molding Process Simulation and Viscoelastic Model for Package Warpage Anticipation 2.5D/3D Chiplets Approach to Advanced Packaging Solutions Automatized Multi-objective Optimization for Reliability of Power Electronics Adhesion Layer Analysis by Spectroscopic Ellipsometry Inline Oxide Removal Through Openair-plasma to Solve Delamination and Improve Bonding in Electronics Heat Spreading in Uncovered Copper Sintered Die-Attach Layers Examined with Lock-In Thermography Evaluation of Mobile Data Center Cooling Performance Based on Embedded Cooling |
6:15pm - 8:00pm |
Welcome Reception Location: Atrium |
Date: Thursday, 12/Sept/2024 | |
8:30am - 7:00pm |
Exhibition Location: Atrium |
10:30am - 11:00am |
Coffee Break & Exhibition Location: Atrium |
10:30am - 11:45am |
Poster Session 2 Location: Atrium Chair: Karl-Friedrich Becker, Fraunhofer IZM Critical Parameters of Bond Strength Measurement on Wafer Bonding Investigating Competing Failure Modes in Microelectronics due to Temperature Variations (ΔT) Development and Characterization of a Chip-film Patch Interposer Integrating an Ultrathin Electrophysiology Chip Reliability Analysis of Surface Mount Interconnect Technologies Suitable for Temperatures up to 200 °C Using Polymer Paste as Dielectric Material for PCB Based Module-to-Module Sintering Non-phthalate and Biobased Plasticizers in Suspensions for Tape Casting The Potential of Machine Learning for Thermal Modelling of SiC Power Modules - A Review Simulation and Experimental Analysis of Thermomechanical Stresses Around Interconnects for W2W Hybrid Bonding RF Characterization and Analysis of Low-loss PCB Materials and Transmission Lines up to 110 GHz Bilayer Encapsulant for Lower Stress Moisture Protection Laser Assisted Bonding (LAB) Based Flip-chip Process for Fine Pitch Solder Bumps Device Using Laser Non-conductive Paste (NCP) Recycling SMD Components for E-Textile Fabrication: A Salt Spray Ageing Study Experimental Study on Reactive Joining Processes on LTCC Substrates Development and Realization of Plasma Activated Low Temperature SiOx-SiOx Fusion Bonding Based on a Collective Die-to-wafer Bonding Process A Novel 8GHz/50MHz Low Noise Dual Frequency PLL. Innovative Active Cell Balancing Circuit Using Common Capacitor for Energy Redistribution |
3:15pm - 3:45pm |
Coffee Break & Exhibition Location: Atrium |
Date: Friday, 13/Sept/2024 | |
8:30am - 1:45pm |
Exhibition Location: Atrium |
10:30am - 11:00am |
Coffee Break & Exhibition Location: Atrium |
10:30am - 11:45am |
Poster Session 3 Location: Atrium Chair: Karl-Friedrich Becker, Fraunhofer IZM An Overview of the Thick Film Copper Technology for Power Electronics Monitoring Cu via Structures and Surrounding Dielectric Stack After CMP Process Simulations of Thermocouple Measurements During Reactive Bonding Processes on LTCC Substrates Modelling the Influence of Stretched Molding Foil on the Overall Dimensions of Molded Packages. Mitigating Gas-induced Performance Degradation in High Reliability Electronic and Optoelectronic Systems Ag and SiO2 Mixed Powder Sintering System Investigation of Side Wall Loss for Development of 6 µm Microbumps for 3D/2.5D Integration Improving The Thinning Module Robustness Vis-a-vis the Bonding Misalignment & the TBM EBR LidroCUT - Laser Processing in Liquids for New Packaging Applications Alignment Between Subsequent 3D Molding Layers for Optimized Performance of 3D Integrated Patch Antennas for Advanced Sensing Applications Use of 3D Printing Techniques in the Development of Electronic Systems, Support Stage in the Digital Transformation of the Laboratories Evolved Finite Difference Model to Investigate Humidity-related Failure Modes for Microelectronic and Power Electronic Devices Study of the Water and Steam Resistance of Thick Film Materials for Sensor Applications up to 300 °C Tape Automated Bonding of an ALPIDE Chip with Flexible PCB Direct Flip Chip Bonding on Laser Induced Graphene Structures for Low-cost Flexible Sensor Devices Reliable Fabrication Methodology for Consistent Supercapacitor Performance |
3:00pm - 3:10pm |
Room Change Location: Atrium |
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