IEEE ESTC 2024
September 11–13, 2024 | Berlin, Germany
Conference Agenda
Overview and details of the sessions of this conference. Please select a date or location to show only sessions at that day or location. Please select a single session for detailed view (with abstracts and downloads if available).
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Session Overview | |
Location: MOA 4 MOA 4 |
Date: Wednesday, 11/Sept/2024 | |
8:30am - 10:30am |
PDC: “Automotive Electronics Reliability – Assurance Approaches and Challenges” I Location: MOA 4 Course instructor: Pradeep Lall |
10:45am - 12:45pm |
PDC: “Automotive Electronics Reliability – Assurance Approaches and Challenges” II Location: MOA 4 Course instructor: Pradeep Lall |
2:40pm - 3:55pm |
Opto1_Photonic Module Packaging Location: MOA 4 Chair: Henning Schröder, Fraunhofer IZM Array Packaging with Integrated Mirrors for High Power Multi-chip UVC-LED Modules 3:05pm - 3:30pm Modular Integration of Quantum Cascade Lasers and Drivers in Glass Bench 3:30pm - 3:55pm Improving the Thermal Management of Power LED Arrays with Diamonds |
5:00pm - 6:15pm |
Opto2_Heterogenous PIC Integration Location: MOA 4 Chair: Giovanni Delrosso, VTT Laser-Assisted Bonding of a Miniature Multichannel Laser Diode Chip to a Silicon Photonics Integrated Circuit with Through-Silicon Alignment 5:25pm - 5:50pm Over 100-GHz Bridge Chip Interconnection Between Photonic and Electrical ICs with a Heat-insulating Stress-relief Membrane Structure 5:50pm - 6:15pm Advanced Ultrathin Spray Coating Process Technology for Heterogeneous Integration Applications |
Date: Thursday, 12/Sept/2024 | |
9:15am - 10:30am |
AMT1_Innovative Assembly Processes Location: MOA 4 Chair: Attila Géczy, Budapest University of Technology and Economics Secondary Optics Assembly for Micro Concentrating Photovoltaics: A Parallelized and Scalable Approach 9:40am - 10:05am Massive Parallel Assembly and Interconnection for Micro-LEDs – a Technical Feasibility Study 10:05am - 10:30am Tape Frozen Detachment Process Using Freeze Chuck for Chip to Wafer |
11:00am - 12:15pm |
AMT2_Computer-aided Process Control Location: MOA 4 Chair: Erik Jung, Fraunhofer IZM Advancements in Epoxy Pattern Quality Checks: Harnessing Artificial Intelligence for Enhanced Low-Contrast Analysis 11:25am - 11:50am Dicing Lane Quality Quantification & Wafer Assessment Using Image Thresholding Techniques 11:50am - 12:15pm AI Deep-Learning Approach for Manufacturing Optimization During Chiplets and Heterogeneous Package Inspection |
1:45pm - 3:15pm |
AMT3_Process for Enhancement of Device Robustness Location: MOA 4 Chair: David Henry, CEA LETI Advanced Wafer Singulation Technique for Miniaturized Metal-oxide (MOX) Micro-hotplates Based Gas Analyzer 2:10pm - 2:35pm Characterizations of Metal-based Thermal Interface Materials (TIM) in a Singulated Flip Chip Ball Grid Array Package 2:35pm - 3:00pm Automated Highspeed Characterization of Optical Waveguide in large-format Glass Substrates |
3:45pm - 5:15pm |
Emerging II Location: MOA 4 Chair: Martin Schneider-Ramelow, Fraunhofer IZM 10 Golden Rules of Chip- Package- Board Interactions Trench-Based Fully Integrated Capacitors for Power Delivery in Heterogeneous Integration Platforms Sustainable Temperature and Pressure Sensing Solution for Tire |
Date: Friday, 13/Sept/2024 | |
9:15am - 10:30am |
AMT4_Hybrid Bonding, Direct Bonding, Heterogeneous Integration Location: MOA 4 Chair: Hoang-Vu Nguyen, University of South-Eastern Norway First Electrical Performance of Self-assembly Applied to Die-to-wafer Hybrid Bonding 9:40am - 10:05am BiCMOS BEOL Coupon Fabrication and Micro Transfer Printing for Heterogeneous Integration Applications 10:05am - 10:30am Impact of Dielectric Types & Surface Profile on Wafer-to-Wafer Hybrid Bonding |
11:00am - 12:15pm |
AMT5_Advanced Materials and Processes Location: MOA 4 Chair: Attila Géczy, Budapest University of Technology and Economics Thin Substrate Bonding 11:25am - 11:50am System-in-package Building block Development for Future Space Equipment 11:50am - 12:15pm Single Die Process Using Shadow Masks for a 55µm Fine Pitch Array of 4µm-tall Indium Bumps Across an Entire Chip |
1:45pm - 3:00pm |
AMT6_Enhanced Process Control Location: MOA 4 Chair: Knut E. Aasmundtveit, University of South-Eastern Norway Invited Paper: A Novel Approach for Wafer level Solder Reflow and Cleaning of Semiconductor Wafer in Silicon Photonics, MEMS and Advanced Packaging 2:10pm - 2:35pm In-situ Measurement of HCOOH, CO2 and H2O Concentrations During Formic Acid Reflow Soldering 2:35pm - 3:00pm Enhanced Process Control for Dry Etching of Functional TiN Structures on 300 mm Wafer Level. |
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