Enhancing Ease-of-disassembly Tools for Electronic Products: Insights from Assessing Computer Mice
Yi-Hsieh Wang1, Chi-Yi Tsai1, Xiaoling Liu1, Zhaoyang Hank Han1, Ingrid de Pauw2, Bas Flipsen2
1Logitech Europe SA, Lausanne, Switzerland; 2Delft University of Technology, Delft, the Netherlands
Multi-view Graph Convolutional Network for WEEE Classification
Chuangchuang Zhou1,2,3, Yifan Wu1,2,3, Wouter Sterkens1,2,3, Patrick Vandewalle2, Jef Peeters1,3
1LCE, Department of Mechanical Engineering, KU Leuven, Belgium; 2PSI-EAVISE, KU Leuven, Sint-Katelijne-Waver, Belgium; 3Flanders Make@KU Leuven, Belgium
A Color and Depth Image Defect Segmentation Framework for EEE Reuse and Recycling
Yifan Wu1,2, Chuangchuang Zhou1,2,3, Wouter Sterkens1,2,3, Mathijs Piessens1,2, Dieter De Marelle1,2, Wim Dewulf1,2, Jef Peeters1,2
1Department of Mechanical Engineering KU Leuven, Belgium; 2Flanders Make@KU Leuven, Belgium; 3PSI-EAVISE-KU Leuven, Sint-Katelijne-Waver, Belgium
Circular Solutions: A Novel Methodology for Evaluating Circularity Performance in Waste Electrical and Electronic Equipment Management
Dea Wehrli, Kirsten Remmen
Empa, Switzerland
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