Investigation of Semiconductor Die Area as a Reference Variable for LCA
Marina Proske1, Mathilde Billaud2, Christian Clemm3, David Sanchez1, Yannick Lorf1, Lutz Stobbe1
1Fraunhofer IZM, Germany; 2CEA-Leti, France; 3University of Tokyo, Japan
Parametric Modeling for Improved Die Area Estimation in the Life Cycle Assessment of Electronic Systems
Augustin Wattiez, Robin Dethienne, David Bol
UCLouvain, Belgium
Comparative Life Cycle Assessment (LCA) of Redistribution Layers for 3D Integration
Suzanne Guillou, Damien Saint-Patrice, Laura Vauche, Laetitia Castagné, Stéphane Moreau, Rémi Vélard, Léa Di Cioccio
CEA-Leti, Univ. Grenoble Alpes, France
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